Electronic Discovery in a Global Environment The Law and the TechnologyUniversity of Virginia Law School
Monday -Thursday, October 12 to 22, 2009
Classes meet at WB 121 from 8:30 to 9:50 ET
Course Lead: John Tredennick
Lecturer: John Tredennick
In our first session we will start with an introduction to electronic discovery and the relevant Federal Rules of Civil Procedure. We will talk about the problems surrounding the explosion of digital content and the globalization of the business world. I will also introduce you to Catalyst CR and the TREC problem on which we will be working.
The Zubalake Cases: A series of cases issued by District Court Judge Scheindlin in New York set forth new duties for counsel and client and arguably started modern eDiscovery as we know it today. I have excerpted the three most important cases (out of five) for your review. These will be discussed and referred to throughout the course.??
Guest Lecturer: Magistrate Judge John M. Facciola, United States District Court for the District of Columbia. Learn more. . .
Judge Facciola has written some of the most significant opinions on electronic discovery issues. He has agreed to share his thoughts on many of this difficult and important issues.
If Sherlock Holmes lived today, he might well be a forensics technologist. This session will cover what data can - and cannot - be recovered from computers, cell phones, flash drives, digital copiers, iPods, GPS devices, cameras, computer swipe cards, etc. How do you find good experts? How do you make sure the evidence is preserved? What really happens in a computer forensics lab? How do experts cull, de-dupe, de-NIST, analyze and extract data? How do you work with these experts? What pitfalls exist and how do you avoid them? This session will cover the basics of computer forensics in plain English.
Guest Lecturers: Sharon Nelson and John Simek, Sensei Enterprises Inc., Fairfax VA.??Learn more. . .
Guest Lecturers: Jim Eidelman and Chris Toomey, Catalyst Consulting, Denver CO?(by Web Conference). Learn more. . .
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